January 28, 2010
On January 19-21, 2010, Mr. Brad McGoran, Dr. John Fessler, and Dr. Ron Vidano hosted a meeting of experts in Exponent’s Menlo Park headquarters as part of the American National Standards Institute (ANSI) National Committee for Information Technology Standards (NCITS) standards writing committee for smartcards and related devices. The group consisted of approximately 50 experts from companies and agencies such as Sony, Infineon, DoD, NIST, 3M, American Express, Bayer, HID Global, Visa, and approx. 20 others who spent the three day set of meetings debating, revising, and refining standards relating to identification cards, documents, and radio frequency devices containing integrated circuit chips.
Exponent presented revised test methods relating to electrostatic discharge (ESD) which were supported by the national body and will be presented to the international standards body in March for possible inclusion in the relevant International Organization for Standardization (ISO) standards. Mr. McGoran, Dr. Fessler, and Dr. Vidano also discussed topics such as device reliability tests, life prediction, antenna classes and power, and protocol/systems interoperability of contact and contactless smartcards during the course of the meetings.
Exponent offered and was selected to host the next international meeting concerning test methods at our Menlo Park headquarters from March 2-4 which is expected to include delegations of experts from France, Germany, China, Japan, Singapore, New Zealand, Korea, UK, and the US.