Dr. Verghese specializes in materials engineering, and is experienced at failure analysis, reliability engineering, materials selection, and product development. He has investigated materials issues in consumer electronics products, medical devices, building materials, and fittings and fasteners. Key areas of investigation include stress corrosion cracking, fretting, contaminant analysis, electronic material failures, coating failures, and cosmetic defects. He has prior experience in product development, manufacturing, and quality and reliability of microelectromechanical systems (MEMS), high frequency microelectronics, and fiber optic components and systems.
Before joining Exponent, Dr. Verghese was a reliability engineer in the Semiconductor Products Group at Agilent Technologies, Inc., and a product development engineer at Axsun Technologies, Inc. At Agilent, he was responsible for reliability assessment and qualification of high volume RF devices. At Axsun, he led a MEMS device team and developed test capabilities, packaging processes, and yield improvements for a fiber optic spectrometer. Dr. Verghese has also taught “Introduction to Materials” in the College of Engineering at San Jose State University.
Guyer EP, Eiselstein L, Verghese P. Accelerated testing of active implantable medical devices. Paper No. 09464, Corrosion 2009, NACE International, Atlanta, GA, 2009.
Verghese P, Clarke DR. Piezoelectric contributions to the electrical behavior of ZnO varistors. Journal of Applied Physics 2000; 87(9):4430–4438.
Verghese P, Clarke DR. Surface textured zinc oxide films. Journal of Materials Research 1999; 14(3):1039–1045.
Tavernier PR, Verghese P, Clarke DR. Photoluminescence from laser assisted debonded epitaxial GaN and ZnO films. Applied Physics Letters 1999; 74:18:2678–2680.