Catrice Kees

Dr. Kees is trained in materials engineering and is a physicist specializing in semiconductor devices and consumer electronics including thin-film electronics, light-emitting diodes (LEDs), and flexible optoelectronics. She has particular expertise in laboratory-based device testing, including photoluminescence (PL), ultra-violet/visible (UV-Vis) spectroscopy, and current-voltage (I-V) electrical testing. 

Dr. Kees is also experienced with thin film device design, fabrication, metrology, root cause analysis, and manufacturing. She is well versed in experimental and theoretical methods used to evaluate new organic LED (OLED) device architectures and structures which led to efficiency and stability enhancements. She also has experience with using statistical modeling for data analysis of semiconductor dielectric thin film quality and particulate contamination issues in order to mitigate quality control excursions. Dr. Kees is proficient in multiple engineering software suites such as JMP, Mathematica, LabView, SQL, and Python.

Prior to joining Exponent, Dr. Kees was a TD Module & Integration Yield Engineer at Intel where she investigated and developed the next generation semiconductors in a cleanroom environment using Silicon Oxide (SiOx) and Silicon Nitride (SiNx) Plasma Enhanced Chemical Vapor Deposition (PECVD) production equipment. As a process engineer, she collaborated across functional teams to develop safety, quality, and maintenance training and guidelines for new engineers and manufacturing technicians.

Dr. Kees received her Ph.D. in the Materials Science & Engineering department at Rutgers University where she worked on blue polymer-based organic light-emitting diodes (P-OLEDs). Her graduate work consisted of a quantitative assessment of economic, energy, and sustainability impacts of different OLED device architectures, as well as theoretical electromagnetic simulations that demonstrated the local electromagnetic fields of metasurfaces can be used to improve the stability of phosphorescent OLED materials. Dr. Kees garnered knowledge in metallic and polymer thin film deposition techniques including spin coating, physical vapor deposition (PVD), electron-beam (E-beam) sputter deposition, and nanoimprint lithography. In addition, she utilized various metrology tools such as optical and dark-field microscopy, Scanning Electron Microscopy (SEM), and Atomic Force Microscopy (AFM) throughout her tenure.