Gabriel Ganot
Gabriel S. Ganot, Ph.D., P.E., CWI
Managing Engineer
Materials & Corrosion Engineering
  • Menlo Park

Dr. Ganot specializes in failure analysis, metallurgy, materials science, and fractography. He has performed failure analysis investigations relating to metal failures in the automotive, medical device, consumer electronics, oil and gas, commercial and residential plumbing, and construction industries. He has extensive processing, microstructural, and property development expertise utilizing optical and scanning electron microscopy, metallurgical analyses, and mechanical testing techniques.

Prior to joining Exponent, he was Graduate Research Assistant at Columbia University, where he received his doctoral degree in 2012 specializing in semiconductor processing with an emphasis on thin film technologies, particularly laser crystallization and defect formation in thin films. Dr. Ganot’s thesis work dealt with the crystallization of semiconductor thin films for use in advanced liquid crystal displays (LCDs), active matrix organic light-emitting diode (AMOLED) displays, three-dimensional integrated circuits (3D-ICs), and solar cells. This included the fabrication of thin-film-based structures in a cleanroom environment, laser-based melt mediated crystallization, and subsequent microstructural analysis. He is well-versed in thin film metrology techniques, including SEM, AFM, and electron backscatter diffraction (EBSD).

Additionally, while at Columbia, Dr. Ganot was a teaching assistant for the courses entitled “Thermodynamics and Reactions in Solids,” and “Elements of Materials Science.”

CREDENTIALS & PROFESSIONAL HONORS

  • Ph.D., Materials Science and Engineering, Columbia University, 2012
  • M.S., Materials Science and Engineering, Columbia University, 2007
  • B.S., Materials Science and Engineering, Lehigh University, 2006, with honors
  • B.S., Integrated Business and Engineering, Lehigh University, 2006, with honors

LICENSES & CERTIFICATIONS

Licensed Metallurgical Engineer, California, #MT1981

Licensed Professional Engineer, New York, #096866

Certified Welding Inspector (CWI), American Welding Society, #16020161

Publications

Birringer RP, Ganot GS, James BA. Failure analysis of internal fixation medical devices: Overview and case studies. Journal of Failure Analysis and Prevention 2016; 16:849–857

Ganot GS, Van der Wilt PC, Effron HK, Turk BA, Chung UJ, Chitu AM, Limanov AB, Im JS. Mechanism of twin formation in excimer-laser-induced lateral solidification of Si films. MRS Proceedings 2012, Vol. 1426.

K. Omori, Ganot GS, Chung UJ, A.M Chitu, Limanov AB, Im JS. Flash-lamp-induced lateral solidification of thin Si films. MRS Proceedings 2011, Vol. 1321.

Im JS, Monica Chahal, van der Wilt PC, Chung UJ, Ganot GS, Chitu AM, Kobayashi N, Ohmori K, Limanov AB. Mixed-phase solidification of thin Si films on SiO2. J Cryst Growth 2010; 312:2775.

Presentations

Ganot GS, Birringer RP, James B. Failure analysis of bone plates and screws. Materials Science & Technology 2014.

Ganot GS, Van der Wilt PC, Effron HK, Turk BA, Chung UJ, Chitu AM, Limanov AB, Im JS. Mechanism of twin formation in excimer-laser-induced lateral solidifcation of Si films. 2012 Spring MRS Meeting, San Francisco, CA, 2012.

Ganot GS, Chung UJ, Limanov AB, Im JS. Analysis of pulsed-laser-induced melting and solidification of high-aspect-ratio Si rods. Poster presentation, 2011 Spring MRS Meeting, San Francisco, CA 2011.

Ganot GS, Deep M, Van der Wilt PC, Chung UJ, Chitu AM, Limanov AB, Im JS. Laser crystallization of Si films for fabrication 3-D integrated circuits. 2008 Fall MRS Meeting, Boston, MA, 2008.

News & Events

CREDENTIALS & PROFESSIONAL HONORS

  • Ph.D., Materials Science and Engineering, Columbia University, 2012
  • M.S., Materials Science and Engineering, Columbia University, 2007
  • B.S., Materials Science and Engineering, Lehigh University, 2006, with honors
  • B.S., Integrated Business and Engineering, Lehigh University, 2006, with honors

LICENSES & CERTIFICATIONS

Licensed Metallurgical Engineer, California, #MT1981

Licensed Professional Engineer, New York, #096866

Certified Welding Inspector (CWI), American Welding Society, #16020161