Academic Credentials
  • Ph.D., Materials Science and Engineering, Cornell University, 2023
  • B.A., Physics, Vassar College, 2017

Dr. Connolly is a materials scientist with expertise in materials characterization and analysis, with a particular focus on thin film materials and their structural evolution during thermal processing. She has extensive background in characterization techniques, including Raman spectroscopy, scanning electron microscopy, energy-dispersive X-ray spectroscopy (EDS), and synchrotron X-ray diffraction (XRD), as well as in experimental design and method development. Her work focuses on the application of these and other tools in order to understand and characterize failures in products and consumer electronics.

Prior to joining Exponent, Dr. Connolly completed her doctoral work at Cornell University, where she studied the evolution of non-equilibrium phases in thin film oxides due to laser annealing. Her work involved the development of laser annealing techniques for materials discovery, including creating a fully novel method for analyzing the structural evolution in situ using synchrotron XRD, and assisting on its implementation for fully autonomous materials discovery of oxide phases. Dr. Connolly also worked with ultra-wide bandgap semiconductors, including gallium oxide, with applications in electronics for extreme environments.