Academic Credentials
  • Ph.D., Physics, Georgia Institute of Technology, 2013
  • B.S., Physics, Tsinghua University, 2007
Licenses & Certifications
  • Certified Fire and Explosion Investigator (CFEI)

Dr. Hu's area of expertise is product safety evaluation and failure analysis of electrical and electronic systems. She has worked extensively on technical investigations in the following fields: automotive electronic systems, including hardware level and system level evaluations; consumer products, including circuit design reviews and prototype validation testing; and energy storage systems, including risk assessments and design failure mode analyses. Dr. Hu has also assisted clients with technology landscaping review regarding technical standards, regulatory requirements and pre-certification preparation for the US, Canada and European market. In addition, Dr. Hu is experienced with design of experiments, surface characterization, and electrical and magneto-transport measurements in the semiconductor physics domain.

Before joining Exponent, Dr. Hu was a senior scientist at Halliburton where she worked on developing gamma ray sensing instruments for oil and gas exploration and well integrity intervention using scintillation detectors. She is also an inventor of oil field technology with nine US patents issued.

As a graduate research assistant at the Georgia Institute of Technology, Dr. Hu performed fundamental research in graphene physics and demonstrated the quantum phenomenon in graphene based electronics. She worked on understanding the growth mechanism and improved the growth process to achieve high quality graphene thin film obtained through thermal sublimation of silicon carbide in an induction furnace. She mastered laboratory skills in surface analysis (AFM, SEM, XPS, Raman, Ellipsometer, LEED), nanodevice fabrication (E-beam lithography, RIE, ICP, E-BEAM evaporation, carbon coater, ALD), and electrical and magnetotransport measurements (Lock-in amplifier, cryogenic measurements, Hall effect measurements, and resistivity measurements).