Academic Credentials
  • Ph.D., Materials Science and Engineering, Columbia University, 2012
  • M.S., Materials Science and Engineering, Columbia University, 2007
  • B.S., Materials Science and Engineering, Lehigh University, 2006
  • B.S., Integrated Business and Engineering, Lehigh University, 2006
Licenses & Certifications
  • Professional Engineer Metallurgical, California, #1981
  • Professional Engineer, New York, #96866
  • Professional Engineer Metallurgical, Texas, #146086
  • American Welding Society Certified Welding Inspector (CWI)
Professional Honors
  • 2013 Graduate Student Life Award, Columbia University
Professional Affiliations
  • ASM International
  • ASTM International, ASTM Committee A01 Steel, Stainless Steel and Related Alloys
    • A01.02 Structural Steel for Bridges, Buildings, Rolling Stock, and Ships
    • A01.05 Steel Reinforcement
    • A01.05.01 Reinforcing Bars
    • A01.09 Carbon Steel Tubular Products
    • A01.22 Steel Forgings and Wrought Fittings for Piping Applications and Bolting Materials for Piping and Special Purpose Applications
    • A01.22.01 Bolting

Dr. Ganot specializes in failure analysis and failure prevention of engineered components and systems. His specific expertise includes metallurgy, materials science, fracture/fractography, and design.

Dr. Ganot has leveraged this expertise on numerous failure analysis investigations relating to metal and material failures in a wide variety of industries and components. These include: oil and gas, industrial machinery and equipment, building and construction, automotive, commercial and residential plumbing, medical devices, consumer electronics/products, and sporting goods. As a Certified Welding Inspector, he also has analyzed failed welds both large and small that are associated with components in these industries.

A common theme among Dr. Ganot's work is the use of fractography, microscopy, metallurgical analyses, and mechanical testing techniques to identify the root cause of a failure. He also applies a multi-disciplinary approach to solving unique and complex problems by utilizing Exponent's broad and deep expertise in other practice areas. He has extensive processing, microstructural, and property development expertise. Dr. Ganot has conducted many failure analyses utilizing optical and scanning electron microscopy, computed tomography (CT), metallurgical analyses, microhardness, nanoindentation, analytical modeling, and novel mechanical testing techniques.

Prior to joining Exponent, he was Graduate Research Assistant at Columbia University, where he received his doctoral degree in 2012 specializing in semiconductor processing with an emphasis on thin film technologies, particularly laser crystallization and defect formation in thin films. Dr. Ganot's thesis work dealt with the crystallization of semiconductor thin films for use in advanced liquid crystal displays (LCDs), active matrix organic light-emitting diode (AMOLED) displays, three-dimensional integrated circuits (3D-ICs), and solar cells. This included the fabrication of thin-film-based structures in a cleanroom environment, laser-based melt mediated crystallization, and subsequent microstructural analysis. He is well-versed in thin film metrology techniques, including SEM, AFM, and electron backscatter diffraction (EBSD).